INTERNATIONAL PATENT: SHENZHEN HANSWELL TECHNOLOGY CO., LTD., 深圳市华汉伟业科技有限公司 FILES APPLICATION FOR "THREE-DIMENSIONAL MEASUREMENT DEVICE AND METHOD FOR IMPROVING PROJECTION BRIGHTNESS UNIFORMITY"

Posted On: 2026-02-08

GENEVA, Feb. 8 -- SHENZHEN HANSWELL TECHNOLOGY CO., LTD. (Room 1702 To 1706, Building 2, Vankey Cloud City Phase 6, Tongfa South Road, Xili Community, Xili Street, Nanshan District,Shenzhen, Guangdong 518000), 深圳市华汉伟业科技有限公司 (中国广东省深圳市南山区西丽街道西丽社区同发南路万科云城六期二栋1702房-1706房) filed a patent application (PCT/CN2025/112450) for "THREE-DIMENSIONAL MEASUREMENT DEVICE, AND METHOD FOR IMPROVING PROJECTION BRIGHTNESS UNIFORMITY" on Aug 04,...

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इस लेख के रीप्रिंट को खरीदने या इस प्रकाशन का पूरा फ़ीड प्राप्त करने के लिए, कृपया हमे संपर्क करें.

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INTERNATIONAL PATENT: SHENZHEN HANSWELL TECHNOLOGY CO., LTD., 深圳市华汉伟业科技有限公司 FILES APPLICATION FOR "THREE-DIMENSIONAL MEASUREMENT DEVICE AND METHOD FOR IMPROVING PROJECTION BRIGHTNESS UNIFORMITY"