INTERNATIONAL PATENT: SHENZHEN HANSWELL TECHNOLOGY CO., LTD., 深圳市华汉伟业科技有限公司 FILES APPLICATION FOR "DEFECT DETECTION METHOD AND APPARATUS AND MODEL TRANSFER METHOD AND APPARATUS"

Posted On: 2026-02-02

GENEVA, Feb. 2 -- SHENZHEN HANSWELL TECHNOLOGY CO., LTD. (Room 1702 To 1706, Building 2, Vankey Cloud City Phase 6, Tongfa South Road, Xili Community, Xili Street, Nanshan District,Shenzhen, Guangdong 518000), 深圳市华汉伟业科技有限公司 (中国广东省深圳市南山区西丽街道西丽社区同发南路万科云城六期二栋1702房-1706房) filed a patent application (PCT/CN2025/112443) for "DEFECT DETECTION METHOD AND APPARATUS, AND MODEL TRANSFER METHOD AND APPARATUS" on Aug 04, 2025. With publi...

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INTERNATIONAL PATENT: SHENZHEN HANSWELL TECHNOLOGY CO., LTD., 深圳市华汉伟业科技有限公司 FILES APPLICATION FOR "DEFECT DETECTION METHOD AND APPARATUS AND MODEL TRANSFER METHOD AND APPARATUS"