INTERNATIONAL PATENT: SHENZHEN GUANGYI TECH CO., LTD., 深圳市光羿科技有限公司 FILES APPLICATION FOR "DEFECT IDENTIFICATION METHOD AND SYSTEM FOR ELECTROCHROMIC DEVICE AND MEDIUM"

Posted On: 2025-06-30

GENEVA, June 30 -- SHENZHEN GUANGYI TECH CO., LTD. (1/F, Building 5, Meigu, Building 3.5.6, Meisheng Huigu Industrial Park, No. 83 Dabao Road, No. 33 Shanghe Community, Xin'an Street, Bao'an District,Shenzhen, Guangdong 518000), 深圳市光羿科技有限公司 (中国广东省深圳市宝安区新安街道上合社区33区大宝路83号美生慧谷科技园3.5.6栋美谷5栋一楼) filed a patent application (PCT/CN2024/126084) for "DEFECT IDENTIFICATION METHOD AND SYSTEM FOR ELECTROCHROMIC DEVICE, AND ...

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INTERNATIONAL PATENT: SHENZHEN GUANGYI TECH CO., LTD., 深圳市光羿科技有限公司 FILES APPLICATION FOR "DEFECT IDENTIFICATION METHOD AND SYSTEM FOR ELECTROCHROMIC DEVICE AND MEDIUM"