GENEVA, July 7 -- SHANGHAI YUWEI SEMICONDUCTOR TECHNOLOGY CO., LTD (Room 01, 1-4/F, Building 10, Lane 899, Zu Chongzhi Road, China (Shanghai) Pilot Free Trade ZonePudong New Area, Shanghai 201208), 上海御微半导体技术有限公司 (中国上海市浦东新区中国(上海)自由贸易试验区祖冲之路899号10幢1-4层01室) filed a patent application (PCT/CN2024/083760) for "DEFECT DETECTION SYSTEM, METHOD AND APPARATUS, DEVICE, AND STORAGE MEDIUM" on Mar 26, 2024. With publication no. WO/2025/138465, the details related to the ...