INTERNATIONAL PATENT: SHANGHAI UNITED IMAGING MICROELECTRONICS TECHNOLOGY CO., LTD., 上海联影微电子科技有限公司 FILES APPLICATION FOR "PRESSURE RECOGNITION METHOD, DATA CORRECTION METHOD, APPARATUS AND COMPUTER DEVICE"

GENEVA, Feb. 8 -- SHANGHAI UNITED IMAGING MICROELECTRONICS TECHNOLOGY CO., LTD. (Floors 1, 4, 5, Building 4, 150 Lane, Taiye StreetJiading District, Shanghai 201800), 上海联影微电子科技有限公司 (中国上海市嘉定区泰业街150弄4号楼1层、4层、5层) filed a patent application (PCT/CN2025/111294) for "PRESSURE RECOGNITION METHOD, DATA CORRECTION METHOD, APPARATUS, AND COMPUTER DEVICE" on Jul 29, 2025. With publication no. WO/2026/026813, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted u...