INTERNATIONAL PATENT: SHANGHAI POLYTECHNIC UNIVERSITY, 上海第二工业大学 FILES APPLICATION FOR "PCB DEFECT DETECTION METHOD AND SYSTEM BASED ON IMPROVED YOLOV7 ALGORITHM"

GENEVA, June 29 -- SHANGHAI POLYTECHNIC UNIVERSITY (No.2360 Jin Hai RoadPudong New Area, Shanghai 201209), 上海第二工业大学 (中国上海市浦东新区金海路2360号) filed a patent application (PCT/CN2024/111986) for "PCB DEFECT DETECTION METHOD AND SYSTEM BASED ON IMPROVED YOLOV7 ALGORITHM" on Aug 14, 2024. With publication no. WO/2025/130088, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): XU, Jie (No.236...