INTERNATIONAL PATENT: SEMITEC CORPORATION, ＳＥＭＩＴＥＣ株式会社 FILES APPLICATION FOR "TEMPERATURE MEASURING DEVICE AND TEMPERATURE CALIBRATION METHOD FOR SAME"

GENEVA, June 17 -- SEMITEC CORPORATION (7-7, Kinshi 1-Chome, Sumida-ku Tokyo1308512), ＳＥＭＩＴＥＣ株式会社 (東京都墨田区錦糸一丁目７番７号) filed a patent application (PCT/JP2024/042173) for "TEMPERATURE MEASURING DEVICE, AND TEMPERATURE CALIBRATION METHOD FOR SAME" on Nov 28, 2024. With publication no. WO/2025/121243, the details related to the patent application was published on Jun 12, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ...