INTERNATIONAL PATENT: SEMITEC CORPORATION, ＳＥＭＩＴＥＣ株式会社 FILES APPLICATION FOR "TEMPERATURE MEASUREMENT METHOD, THERMOPHYSICAL PROPERTY VALUE CALCULATION METHOD AND OBJECT INTERIOR SEARCH METHOD"

GENEVA, Dec. 30 -- SEMITEC CORPORATION (7-7, Kinshi 1-Chome, Sumida-ku Tokyo1308512), ＳＥＭＩＴＥＣ株式会社 (東京都墨田区錦糸一丁目７番７号) filed a patent application (PCT/JP2025/020366) for "TEMPERATURE MEASUREMENT METHOD, THERMOPHYSICAL PROPERTY VALUE CALCULATION METHOD, AND OBJECT INTERIOR SEARCH METHOD" on Jun 05, 2025. With publication no. WO/2025/263334, the details related to the patent application was published on Dec 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Pr...