INTERNATIONAL PATENT: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO.LTD. FILES APPLICATION FOR "NON-DESTRUCTIVE METHOD AND DEVICE FOR DETECTING BULK DEFECTS AND DETERMINING THEIR DEPTH DISTRIBUTION IN SEMICONDUCTOR WAFERS"

GENEVA, Nov. 17 -- SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO.LTD. (Prielle Kornelia utca 2.1117 Budapest) filed a patent application (PCT/HU2025/050025) for "NON-DESTRUCTIVE METHOD AND DEVICE FOR DETECTING BULK DEFECTS AND DETERMINING THEIR DEPTH DISTRIBUTION IN SEMICONDUCTOR WAFERS" on May 07, 2025. With publication no. WO/2025/233643, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SZARVAS, Tamas (Rakos ter 35.1142 Budapest), POTHORSZKY, Szilard Laszlo (Major utca 12/B1119 Budapest)

Abstract: The device and method ac...