INTERNATIONAL PATENT: SEMICS INC., (주)쎄믹스 FILES APPLICATION FOR "DIE LEVEL TEST SYSTEM AND CONTROL METHOD THEREOF"

GENEVA, Jan. 27 -- SEMICS INC. (732-37 Gyeongchung-daero, Gonjiam-eup,Gwangju-si,Gyeonggi-do 12800), (주)쎄믹스 (경기도광주시곤지암읍 경충대로 732-37) filed a patent application (PCT/KR2025/010100) for "DIE LEVEL TEST SYSTEM AND CONTROL METHOD THEREOF" on Jul 10, 2025. With publication no. WO/2026/019160, the details related to the patent application was published on Jan 22, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): YU, Won Seek (732-37 Gyeongchung-daero, Gonjiam-eup,Gwangju-si,G...