INTERNATIONAL PATENT: SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD FILES APPLICATION FOR "SYSTEM AND METHOD FOR INSPECTING DEVICES FOR INTERNAL DEFECTS AT ABOUT SIDEWALLS THEREOF CAUSED BY WAFER SINGULATION PROCESSES"

GENEVA, July 9 -- SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD (25 Kallang Avenue #04-01,Kallang Basin Industrial Estate,Singapore 339416) filed a patent application (PCT/SG2024/050835) for "SYSTEM AND METHOD FOR INSPECTING DEVICES FOR INTERNAL DEFECTS AT ABOUT SIDEWALLS THEREOF CAUSED BY WAFER SINGULATION PROCESSES" on Dec 27, 2024. With publication no. WO/2025/144103, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): AMANULLAH, Ajharali (806 Bedok ReservoirRoad#04-01 BaywaterSingapore 479243), GE, Han Cheng (519d Tamp...