GENEVA, June 19 -- SEE ALL AI INC. (39 Technology WaySuite 3W1Nashua, New Hampshire 03060) filed a patent application (PCT/US2024/059213) for "WIRE-BASED CALIBRATION APPARATUS FOR X-RAY IMAGING SYSTEMS" on Dec 09, 2024. With publication no. WO/2025/123036, the details related to the patent application was published on Jun 12, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): GREGERSON, Eugene Alma (686 Country CourtNorth Salt Lake, Utah 84054)
Abstract:
A calibration target for use with a radiographic image detector includes a target body securable to the image detector and a plurality of r...