INTERNATIONAL PATENT: SB TECHNOLOGY, INC. FILES APPLICATION FOR "DIAGNOSTIC SYSTEMS AND METHODS FOR BATTERY DEFECT IDENTIFICATION"

GENEVA, Oct. 28 -- SB TECHNOLOGY, INC. (303 S. Broadway, Ste 105Tarrytown, New York 10591) filed a patent application (PCT/US2025/021118) for "DIAGNOSTIC SYSTEMS AND METHODS FOR BATTERY DEFECT IDENTIFICATION" on Mar 24, 2025. With publication no. WO/2025/221415, the details related to the patent application was published on Oct 23, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): XIAO, Ang (303 S. Broadway, Ste 105Tarrytown, New York 10591), AGARWAL, Shivang (303 S. Broadway, Ste 105Tarrytown, New York 10591), CRIVELLI-DECKER, Jordan E. (303 S. Broadway, Ste 105Tarrytown, New York 10591), SOU...