INTERNATIONAL PATENT: SAVARIA, YVON, RAGAB, AKMED, AMER, MOSTAFA, ABUELNASR, AHMED, GOSSELIN, BENOIT, CORPORATION DE L'ECOLE POLYTECHNIQUE DE MONTREAL, UNIVERSITE LAVAL FILES APPLICATION FOR "SYSTEM AND METHOD FOR DETERMINING OPTIMIZED DEVICE PARAMETERS OF A MULTI-VARIABLE ARCHITECTURE"

Posted On: 2025-08-11

GENEVA, Aug. 11 -- SAVARIA, Yvon (CORPORATION DE L'ECOLE POLYTECHNIQUE DE MONTREAL2500 Chem. de PolytechniqueMontreal, Quebec H3T 1J4), RAGAB, Akmed (CORPORATION DE L'ECOLE POLYTECHNIQUE DE MONTREAL2500 Chem. de PolytechniqueMontreal, Quebec H3T 1J4), AMER, Mostafa (CORPORATION DE L'ECOLE POLYTECHNIQUE DE MONTREAL2500 Chem. de PolytechniqueMontreal, Quebec H3T 1J4), ABUELNASR, Ahmed (CORPORATION DE L'ECOLE POLYTECHNIQUE DE MONTREAL2500 Chem. de PolytechniqueMontreal, H3T 1J4), GOSSELIN, Benoit (UNIVERSITE LAVAL2325 Rue de l'UniversiteQuebec, Quebec G1V 0A6), CORPORATION DE L'ECOLE POLYTECHNIQUE DE MONTREAL (2500 Chem. de PolytechniqueMontreal, Quebec H3T 1J4), UNIVERSITE LAVAL (2325 Rue de l'UniversiteQuebec, Quebec G1V 0A6) filed a patent ...

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INTERNATIONAL PATENT: SAVARIA, YVON, RAGAB, AKMED, AMER, MOSTAFA, ABUELNASR, AHMED, GOSSELIN, BENOIT, CORPORATION DE L'ECOLE POLYTECHNIQUE DE MONTREAL, UNIVERSITE LAVAL FILES APPLICATION FOR "SYSTEM AND METHOD FOR DETERMINING OPTIMIZED DEVICE PARAMETERS OF A MULTI-VARIABLE ARCHITECTURE"