GENEVA, July 3 -- SANDISK TECHNOLOGIES, INC. (951 Sandisk DriveMilpitas, California 95035) filed a patent application (PCT/US2024/040817) for "NON-VOLATILE MEMORY WITH LEAK TESTS" on Aug 02, 2024. With publication no. WO/2025/136463, the details related to the patent application was published on Jun 26, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): TIAN, Xuan (c/o Western Digital Technologies, Inc.5601 Great Oaks ParkwaySan Jose, California 95119), LI, Liang (c/o Western Digital Technologies, Inc.5601 Great Oaks ParkwaySan Jose, California 95119), DUTTA, Deepanshu (c/o Western Digital Tech...