INTERNATIONAL PATENT: SANDISK TECHNOLOGIES, INC. FILES APPLICATION FOR "DUMMY MEMORY HOLE DEFECT DETECTION"

GENEVA, Oct. 28 -- SANDISK TECHNOLOGIES, INC. (951 SanDisk DriveMilpitas, California 95035) filed a patent application (PCT/US2025/011255) for "DUMMY MEMORY HOLE DEFECT DETECTION" on Jan 10, 2025. With publication no. WO/2025/221316, the details related to the patent application was published on Oct 23, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): IKAWA, Yusuki (951 SanDisk DriveMilpitas, California 95035), HU, Xiaolong (951 SanDisk DriveMilpitas, California 95035), SAMURA, Kei (951 SanDisk DriveMilpitas, California 95035)

Abstract: Technology for detection of defects in dummy memory hol...