GENEVA, Nov. 11 -- SAMSUNG ELECTRONICS CO., LTD. (129, Samsung-ro,Yeongtong-gu, Suwon-si,Gyeonggi-do 16677) filed a patent application (PCT/KR2025/005823) for "METHOD AND APPARATUS FOR ENHANCED L1 MEASUREMENT REPORT" on Apr 29, 2025. With publication no. WO/2025/230295, the details related to the patent application was published on Nov 06, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): LEE, Deokhui (129, Samsung-ro,Yeongtong-gu, Suwon-si,Gyeonggi-do 16677), YOON, Hoyoung (129, Samsung-ro,Yeongtong-gu, Suwon-si,Gyeonggi-do 16677), KIM, Dongmyung (129, Samsung-ro,Yeongtong-gu, Suwon-si,Gyeong...