INTERNATIONAL PATENT: SAFRAN FILES APPLICATION FOR "X-RAY FLUORESCENCE SPECTROMETRY FOR CHARACTERIZING THE MICROSTRUCTURE OF A METAL ALLOY AND DETECTING CHEMICAL SEGREGATIONS"

GENEVA, May 5 -- SAFRAN (2 boulevard du General Martial Valin75015 PARIS) filed a patent application (PCT/FR2024/051216) for "X-RAY FLUORESCENCE SPECTROMETRY FOR CHARACTERIZING THE MICROSTRUCTURE OF A METAL ALLOY AND DETECTING CHEMICAL SEGREGATIONS" on Sep 17, 2024. With publication no. WO/2025/088255, the details related to the patent application was published on May 01, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): RINKEL, Jean (SAFRANc/o Centre d'Excellence Propriete IntellectuelleRond-point Rene Ravaud, Reau75550 MOISSY-CRAMAYEL), BRUTT, Cecile (SAFRANc/o Centre d'Excellence Propriete ...