INTERNATIONAL PATENT: SAFRAN ELECTRONICS & DEFENSE FILES APPLICATION FOR "METHOD FOR CORRECTING RESIDUAL OPTICAL DEFECTS"

GENEVA, April 14 -- SAFRAN ELECTRONICS & DEFENSE (2 Boulevard du General Martial Valin75015 PARIS) filed a patent application (PCT/FR2024/051306) for "METHOD FOR CORRECTING RESIDUAL OPTICAL DEFECTS" on Oct 04, 2024. With publication no. WO/2025/074066, the details related to the patent application was published on Apr 10, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DELANOY, Clement (SAFRANc/o Centre d'Excellence Propriete IntellectuelleRond-point Rene Ravaud, Reau77550 MOISSY-CRAMAYEL), CAMBOULIVES, Adrien-Richard (SAFRANc/o Centre d'Excellence Propriete IntellectuelleRond-point Rene Rav...