GENEVA, May 27 -- SAFRAN (2, boulevard du General Martial Valin75015 PARIS), ECOLE NORMALE SUPERIEURE PARIS-SACLAY (4 Avenue des Sciences91190 GIF SUR YVETTE), CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS) (3, rue Michel Ange75016 PARIS) filed a patent application (PCT/FR2024/051504) for "METHOD, SYSTEM AND COMPUTER PROGRAM FOR X-RAY INSPECTION OF A PART" on Nov 14, 2024. With publication no. WO/2025/104404, the details related to the patent application was published on May 22, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BETANCUR, Julian (SAFRAN c/o Centre d'Excellence Propriete In...