INTERNATIONAL PATENT: RESEARCH FOUNDATION OF THE CITY UNIVERSITY OF NEW YORK FILES APPLICATION FOR "DEEP LEARNING TECHNIQUE FOR AUTOMATED RADIOLOGICAL IMAGE ANALYSIS AND DISEASE DETECTION"

GENEVA, Nov. 19 -- RESEARCH FOUNDATION OF THE CITY UNIVERSITY OF NEW YORK (230 West 41st Street, 7th Fl.New York, New York 10036) filed a patent application (PCT/US2025/028144) for "DEEP LEARNING TECHNIQUE FOR AUTOMATED RADIOLOGICAL IMAGE ANALYSIS AND DISEASE DETECTION" on May 07, 2025. With publication no. WO/2025/235610, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KHOSRAVI, Pegah (285 Jay StreetBrooklyn, New York 11201)

Abstract: A real-time artificial intelligence (AI) framework is provided for the automated analy...