INTERNATIONAL PATENT: QUALCOMM INCORPORATED FILES APPLICATION FOR "PROFILING AND SIGNALING FOR CLUTTER DOPPLER CHARACTERISTICS IN RF SENSING"

GENEVA, June 18 -- QUALCOMM INCORPORATED (ATTN: International IP Administration5775 Morehouse DriveSan Diego, California 92121-1714) filed a patent application (PCT/US2024/054660) for "PROFILING AND SIGNALING FOR CLUTTER DOPPLER CHARACTERISTICS IN RF SENSING" on Nov 06, 2024. With publication no. WO/2025/122282, the details related to the patent application was published on Jun 12, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HIRZALLAH, Mohammed Ali Mohammed (5775 Morehouse DriveSan Diego, California 92121-1714), YERRAMALLI, Srinivas (5775 Morehouse DriveSan Diego, California 92121-1714),...