INTERNATIONAL PATENT: PRECITEC OPTRONIK GMBH FILES APPLICATION FOR "METHOD AND DEVICE FOR DETECTING CAVITIES IN BONDED WAFERS"

GENEVA, Dec. 15 -- PRECITEC OPTRONIK GMBH (Schleussnerstr. 5463263 Neu-Isenburg) filed a patent application (PCT/EP2025/063038) for "METHOD AND DEVICE FOR DETECTING CAVITIES IN BONDED WAFERS" on May 13, 2025. With publication no. WO/2025/252406, the details related to the patent application was published on Dec 11, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NIMTSCH, Philipp (In den Garten 4135398 GieBen), KRESS, Joshua (LessingstraBe 2864646 Heppenheim), BIALOWONS, Lucas (AnnastraBe 7763225 Langen)

Abstract: In a method for detecting cavities (18) which have formed in a composite struc...