GENEVA, Jan. 26 -- PRECITEC OPTRONIK GMBH (Schleussnerstr. 5463263 Neu-Isenburg) filed a patent application (PCT/EP2025/066047) for "APPARATUS AND METHOD FOR MEASURING WAFERS" on Jun 10, 2025. With publication no. WO/2026/017321, the details related to the patent application was published on Jan 22, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): WEISS, Stephan (PommernstraBe 863110 Rodgau), HOTTINGER, Philipp (Gemundener Str. 1660599 Frankfurt am Main)
Abstract: The invention relates to an apparatus (14) and a method for measuring wafers (10), the apparatus comprising: an optical coherence...