INTERNATIONAL PATENT: PERISENS GMBH FILES APPLICATION FOR "USING MEASUREMENTS AT DIFFERENT ANGLES TO CHARACTERIZE THE INTERNAL STRUCTURE OF A DEVICE UNDER TEST"

GENEVA, Aug. 24 -- PERISENS GMBH (Dornacher Str. 3d85622 Feldkirchen) filed a patent application (PCT/EP2025/053250) for "USING MEASUREMENTS AT DIFFERENT ANGLES TO CHARACTERIZE THE INTERNAL STRUCTURE OF A DEVICE UNDER TEST" on Feb 07, 2025. With publication no. WO/2025/172184, the details related to the patent application was published on Aug 21, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PFEIFFER, Florian (Elritzenstr. 2181825 Munich), CALLIES, Lucas Tobias (Truchthari-Anger 2081829 Munich)

Abstract: The present invention relates to a method for measuring a target area (35) of a dev...