GENEVA, June 16 -- ORBOTECH LTD. (Shderot Hasanhedrin 78110101 Yavne) filed a patent application (PCT/IB2024/061404) for "VERIFYING CORRECTNESS OF COMPUTER VISION DURING SEMICONDUCTOR INSPECTION" on Nov 15, 2024. With publication no. WO/2025/120424, the details related to the patent application was published on Jun 12, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): RAVEH, Gonen (Ha'Shikma 2217986000 Timorim)
Abstract:
An image of a workpiece is forwarded through a graph of a deep neural network model or directed acyclic graph of deep neural network models. The output is then recorded as ...