GENEVA, March 9 -- ORBOTECH LTD. (P. O. Box 2158110101 Yavne) filed a patent application (PCT/IB2024/057398) for "SYSTEM AND METHOD FOR ENHANCED INSPECTION OF SURFACES WITH SPECULAR REFLECTION" on Jul 31, 2024. With publication no. WO/2025/046346, the details related to the patent application was published on Mar 06, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): CHAYET, Haim (62 Katznelson Street7403946 Nes Ziona), HOD, Manuela (50 Shvil Hahalv7952500 Moshav Nir Banim)
Abstract:
An inspection system for enhancing diffuse scattering from a sample during inspection of includes a stage and...