GENEVA, June 16 -- ORBOTECH LTD. (Shderot Hasanhedrin 78110101 Yavne) filed a patent application (PCT/IB2024/061393) for "SEMICONDUCTOR INSPECTION SYSTEM WITH A DEEP NEURAL NETWORK" on Nov 15, 2024. With publication no. WO/2025/120423, the details related to the patent application was published on Jun 12, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): RAVEH, Gonen (Ha'Shikma 2217986000 Timorim)
Abstract:
In a system, such as an optical inspection system, a light source generates a beam of light; a stage holds a workpiece in a path of the beam of light; a detector receives the beam of lig...