INTERNATIONAL PATENT: ORBOTECH LTD. FILES APPLICATION FOR "IN-SITU WAFER STRESS MEASUREMENT BY CHROMATIC CONFOCAL SENSOR SCANNING WITH VIBRATION AND TEMPERATURE COMPENSATION"

GENEVA, Nov. 24 -- ORBOTECH LTD. (Shderot Hasanhedrin 78110101 Yavne) filed a patent application (PCT/IB2025/054936) for "IN-SITU WAFER STRESS MEASUREMENT BY CHROMATIC CONFOCAL SENSOR SCANNING WITH VIBRATION AND TEMPERATURE COMPENSATION" on May 12, 2025. With publication no. WO/2025/238510, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HAYMORE, Scott (Coed RhedynRingland WayNewport Gwent NP18 2TA), BRONFMAN, Arkady (11 David Niv Street, Apt. 378400711 Beer Sheva), GOICHMAN, Tal (8/19 Hakeshet Street5540104 Kiryat Ono), ...