INTERNATIONAL PATENT: OPEN SPACE LABS, INC. FILES APPLICATION FOR "IDENTIFICATION AND ANALYSIS OF AN ENVIRONMENT USING IMAGE-BASED LARGE LANGUAGE MODEL PROCESSING"

GENEVA, Jan. 27 -- OPEN SPACE LABS, INC. (333 Kearny StreetSan Francisco, CA 94108) filed a patent application (PCT/US2025/036131) for "IDENTIFICATION AND ANALYSIS OF AN ENVIRONMENT USING IMAGE-BASED LARGE LANGUAGE MODEL PROCESSING" on Jul 01, 2025. With publication no. WO/2026/019568, the details related to the patent application was published on Jan 22, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): FLEISCHMAN, Michael, Ben (c/o Open Space Labs, Inc.333 Kearny StreetSan Francisco, CA 94108), HEIN, Gabriel (c/o Open Space Labs, Inc.333 Kearny StreetSan Francisco, CA 94108), BYRD, Chris (c/...