INTERNATIONAL PATENT: OOKLA, LLC FILES APPLICATION FOR "DETERMINING OVERSHOOTING CELLS OF BASE STATIONS BASED ON MACHINE LEARNING"

GENEVA, April 21 -- OOKLA, LLC (114 5th Ave., 15th FloorNew York, New York 10011) filed a patent application (PCT/US2024/049173) for "DETERMINING OVERSHOOTING CELLS OF BASE STATIONS BASED ON MACHINE LEARNING" on Sep 30, 2024. With publication no. WO/2025/080451, the details related to the patent application was published on Apr 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KOC, Erdem (114 5th Ave., 15th FloorNew York, New York 10011)

Abstract: A system can determine an overshooting cell of a base station in a mobile network. In some implementations, the system can determine a plural...