INTERNATIONAL PATENT: OMNI DESIGN TECHNOLOGIES, INC. FILES APPLICATION FOR "SAMPLING JITTER AND SKEW TOLERANT ANALOG-TO-DIGITAL CONVERTERS"

GENEVA, Oct. 6 -- OMNI DESIGN TECHNOLOGIES, INC. (1525 McCarthy Blvd., Suite 220Milpitas, CA 95035) filed a patent application (PCT/US2025/017772) for "SAMPLING JITTER AND SKEW TOLERANT ANALOG-TO-DIGITAL CONVERTERS" on Feb 28, 2025. With publication no. WO/2025/207273, the details related to the patent application was published on Oct 02, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LEE, Hae-Seung (4 Brown RoadLexington, MA 02420), El-CHAMMAS, Manar (1601 Miriam Ave, Unit 104Austin, TX 78702)

Abstract: A derivative measurement circuit is configured to sample the input voltage of an input...