GENEVA, June 24 -- NSK LTD. (6-3, Ohsaki 1-chome, Shinagawa-ku, Tokyo1418560), 日本精工株式会社 (東京都品川区大崎一丁目６番３号) filed a patent application (PCT/JP2024/027143) for "STATE DIAGNOSIS SYSTEM, STATE DIAGNOSIS METHOD, AND PROGRAM" on Jul 30, 2024. With publication no. WO/2025/126550, the details related to the patent application was published on Jun 19, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): KITAUCHI Seishiro (c/o NSK Ltd., 5-50, Kugenu...