INTERNATIONAL PATENT: NOVA MEASURING INSTRUMENTS INC. FILES APPLICATION FOR "X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) MEASUREMENT"

GENEVA, Oct. 4 -- NOVA MEASURING INSTRUMENTS INC. (3342 Gateway BlvdFremont, California 94538) filed a patent application (PCT/IB2025/053259) for "X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) MEASUREMENT" on Mar 27, 2025. With publication no. WO/2025/202968, the details related to the patent application was published on Oct 02, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HAIM YACHINI, Michal (50 Derech Yavne St7634323 REHOVOT), POIS, Heath (40720 Ambar PlaceFremont, California 94539), LUND, Parker (1074 Kildare AvenueSunnyvale, California 94087), KLARE, Mark (1 Pine Ridge RoadPoughkeepsie, 126...