GENEVA, April 19 -- NOVA MEASURING INSTRUMENTS INC. (3342 Gateway BlvdFremont, California 94538) filed a patent application (PCT/IB2024/059881) for "RADIATION SOURCE FOR METROLOGY" on Oct 09, 2024. With publication no. WO/2025/078975, the details related to the patent application was published on Apr 17, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): GARCIA, Rudy (407 Appian WayUnion City, California 94587), LOPEZ LOPEZ, Gary (c/o Nova Measuring Instruments Inc.3342 Gateway BlvdFremont, California 94538), DELGADO, Gildardo (5945 Linwood CMNLivermore, California 4550)
Abstract:
A metrolog...