INTERNATIONAL PATENT: NOVA MEASURING INSTRUMENTS INC. FILES APPLICATION FOR "ELECTON BEAM SOURCE FOR X-RAY GENERATION FOR SAMPLE EVALUATION"

GENEVA, April 14 -- NOVA MEASURING INSTRUMENTS INC. (3342 Gateway BlvdFremont, California 94538) filed a patent application (PCT/IB2024/059657) for "ELECTON BEAM SOURCE FOR X-RAY GENERATION FOR SAMPLE EVALUATION" on Oct 03, 2024. With publication no. WO/2025/074282, the details related to the patent application was published on Apr 10, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GARCIA, Rudy (407 Appian WayUnion City, California 94587), DELGADO, Gildardo (5945 Linwood CMNLivermore, California 4550), LOPEZ LOPEZ, Gary (c/o Nova Measuring Instruments Inc.3342 Gateway BlvdFremont, Californi...