INTERNATIONAL PATENT: NOVA MEASURING INSTRUMENTS INC. FILES APPLICATION FOR "CHARGED PARTICLE SOURCE FOR X-RAY APPLICATIONS"

GENEVA, Nov. 3 -- NOVA MEASURING INSTRUMENTS INC. (3342 Gateway BlvdFremont, California 94538) filed a patent application (PCT/IB2025/054162) for "CHARGED PARTICLE SOURCE FOR X-RAY APPLICATIONS" on Apr 21, 2025. With publication no. WO/2025/224606, the details related to the patent application was published on Oct 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): REED, David A. (2742 St. James RoadBelmont, California 94002), DELGADO, Gildardo (5945 Linwood CMNLivermore, California 4550)

Abstract: A charged particle source for use in x-ray applications, the charged particle source includes...