GENEVA, Oct. 27 -- NOVA LTD (5 David Fikes St.7632805 Rehovot) filed a patent application (PCT/IL2025/050304) for "SYSTEM AND METHOD FOR USE IN DEPTH-RESOLVED INSPECTION OF MULTI-LAYER PATTERNED STRUCTURES" on Apr 08, 2025. With publication no. WO/2025/219994, the details related to the patent application was published on Oct 23, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): COHEN, Eyal (5 David Fikes St.7632805 Rehovot)
Abstract: A control system is presented for use in depth-resolved inspection of multi-layer structures. The control system comprises a computerized system capable of proc...