GENEVA, Dec. 1 -- NOVA LTD (5 David Fikes St.7632805 Rehovot) filed a patent application (PCT/IL2025/050431) for "METROLOGY METHOD AND SYSTEM" on May 21, 2025. With publication no. WO/2025/243300, the details related to the patent application was published on Nov 27, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): MACHAVARIANI, Vladimir (5 David Fikes St.7632805 Rehovot), KORET, Roy (5 David Fikes St.7632805 Rehovot), KANDEL, Daniel (5 David Fikes St.7632805 Rehovot), GER, Avron (5 David Fikes St.7632805 Rehovot)
Abstract: A control system for use in metrology measurements of patterned stru...