INTERNATIONAL PATENT: NORDSON CORPORATION FILES APPLICATION FOR "AN X-RAY INSPECTION APPARATUS AND METHOD FOR SEMICONDUCTOR WAFERS AND AN X-RAY SHIELD FOR THE APPARATUS"

GENEVA, Jan. 12 -- NORDSON CORPORATION (28601 Clemens RoadWestlake, Ohio 44145) filed a patent application (PCT/IB2025/056753) for "AN X-RAY INSPECTION APPARATUS AND METHOD FOR SEMICONDUCTOR WAFERS AND AN X-RAY SHIELD FOR THE APPARATUS" on Jul 03, 2025. With publication no. WO/2026/009183, the details related to the patent application was published on Jan 08, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PEECOCK, Benjamin (c/o Nordson Corporation28601 Clemens RoadWestlake, Ohio 44145), DONALDSON-STEWART, Kate Louise (c/o Nordson Corporation28601 Clemens RoadWestlake, Ohio 44145), EGAN, Chr...