INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "PREDICTION OVERLAPPED WITH MEASUREMENT REPORTING"

GENEVA, Feb. 10 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/IB2024/056292) for "PREDICTION OVERLAPPED WITH MEASUREMENT REPORTING" on Jun 27, 2024. With publication no. WO/2025/027413, the details related to the patent application was published on Feb 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SANGUANPUAK, Tachporn (Kaapelitie 4 (Rusko I)90620 Oulu), VOOK, Frederick (2000 W Lucent LaneNaperville, Illinois 60563), AHMADIAN TEHRANI, Amir Mehdi (Werinherstrasse 9181541 Munich), LADDU, Keeth Saliya Jayasinghe (Karakaari 1302610 Espoo), BONFANTE, Andr...