INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "PERIODIC EVENT-TRIGGERED LAYER 1 MEASUREMENT REPORTING"

GENEVA, Feb. 2 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/066349) for "PERIODIC EVENT-TRIGGERED LAYER 1 MEASUREMENT REPORTING" on Jun 12, 2025. With publication no. WO/2026/021739, the details related to the patent application was published on Jan 29, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KOSKELA, Timo (Nokia Solutions and Networks OyKaapelitie 4 (Rusko I)90620 Oulu), GOYAL, Sanjay (Nokia of America Corporation600-700 Mountain AvenueMurray Hill, New Jersey 07974-0636)

Abstract: Various example embodiments relate to devices, methods, ap...