GENEVA, July 1 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2024/085415) for "NWDAF XR ANALYTICS" on Dec 10, 2024. With publication no. WO/2025/131857, the details related to the patent application was published on Jun 26, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): KAHN, Colin (600-700 Mountain AvenueMurray Hill, New Jersey 07974-0636), CHANDRAMOULI, Devaki (3201 Olympus BoulevardDallas, Texas 75019)
Abstract:
An apparatus includes means for receiving, from a network function consumer, a request for analytics related to at least one extended rea...