INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "NW-SIDED MODEL MEASUREMENT REPORTING OVERHEAD REDUCTION FOR AI/ML BEAM MANAGEMENT DATA COLLECTION"

GENEVA, Feb. 24 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/IB2024/057122) for "NW-SIDED MODEL MEASUREMENT REPORTING OVERHEAD REDUCTION FOR AI/ML BEAM MANAGEMENT DATA COLLECTION" on Jul 22, 2024. With publication no. WO/2025/037171, the details related to the patent application was published on Feb 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): REZAIE, Sajad (Alfred Nobels Vej 279220 Aalborg), AHMADIAN TEHRANI, Amir Mehdi (Werinherstrasse 9181541 Munich), LADDU, Keeth Saliya Jayasinghe (Karakaari 1302610 Espoo)

Abstract: Example embodiments of th...