INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "METHOD FOR MONITORING ACCURACY AND IMPROVING SYNTHETIC DATA GENERATION"

GENEVA, Oct. 18 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/058730) for "METHOD FOR MONITORING ACCURACY AND IMPROVING SYNTHETIC DATA GENERATION" on Mar 31, 2025. With publication no. WO/2025/214801, the details related to the patent application was published on Oct 16, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MANALASTAS, Marvin (7906 S Utica Ave, Apt 4dTulsa, Oklahoma 74136), GHAROUNI, Afsaneh (Nokia Solutions and Networks GmbH & Co. KGWerinherstrasse 9181541 Munich), GOSHI, Ece (Nokia Solutions and Networks GmbH & Co. KGWerinherstrasse 918...