INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "METHOD AND APPARATUS FOR FRACTIONAL MEASUREMENT GAPS"

GENEVA, Oct. 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/FI2025/050141) for "METHOD AND APPARATUS FOR FRACTIONAL MEASUREMENT GAPS" on Mar 24, 2025. With publication no. WO/2025/210296, the details related to the patent application was published on Oct 09, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CAUDURO DIAS DE PAIVA, Rafael (Nokia Denmark A/SAlfred Nobels Vej 279220 Aalborg), HARRIS, John (Nokia of America Corporation600-700 Mountain AvenueMurray Hill, New Jersey 07974-0636), PEDERSEN, Klaus, Ingemann (Nokia Denmark A/SAlfred Nobels Vej 279220...