GENEVA, Feb. 3 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/IB2024/055304) for "MEASUREMENT REPETITION" on May 30, 2024. With publication no. WO/2025/022187, the details related to the patent application was published on Jan 30, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): BONFANTE, Andrea (12 rue Jean Bart91300 Massy), LADDU, Keeth Saliya Jayasinghe (Karakaari 1302610 Espoo)
Abstract:
Example embodiments of the present disclosure relate to methods, devices, apparatuses and computer readable storage medium of measurement repetition. In a method, a f...