INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "MEASUREMENT OFFLOADING"

GENEVA, Nov. 24 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/IB2025/054747) for "MEASUREMENT OFFLOADING" on May 06, 2025. With publication no. WO/2025/238477, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KAINULAINEN, Jani-Pekka (Broers Building, Hauser ForumCambridge CB3 0FA), DALSGAARD, Lars (Kaapelitie 4 (Rusko I)90620 Oulu), REDDY, A Phanikumar (Manyata Embassy Business ParkBangalore 560045), KAPURUHAMY BADALGE, Shashika Manosha (Kaapelitie 4 (Rusko I)90620 Oulu), KOSKINEN, Jussi...