INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "LOS-NLOS INDICATOR MEASUREMENT AND INDICATION PROCEDURES WITH BW AGGREGATION AND FREQUENCY HOPPING"

GENEVA, Nov. 17 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/IB2025/054584) for "LOS-NLOS INDICATOR MEASUREMENT AND INDICATION PROCEDURES WITH BW AGGREGATION AND FREQUENCY HOPPING" on May 01, 2025. With publication no. WO/2025/233774, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JOSHI, Satya Krishna (Kaapelitie 4 (Rusko I)90620 Oulu), CHA, Hyun-Su (2000 W Lucent LaneNaperville, Illinois 60563-1443)

Abstract: A UE receives, from an LMF, a request message indicating that the UE shoul...