INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "EVENT TRIGGERED MEASUREMENT REPORT"

GENEVA, Nov. 17 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/060255) for "EVENT TRIGGERED MEASUREMENT REPORT" on Apr 14, 2025. With publication no. WO/2025/233087, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GOYAL, Sanjay (Nokia of America Corporation600-700 Mountain AvenueMurray Hill, New Jersey 07974-0636), KOSKELA, Timo (Nokia Solutions and Networks OyKaapelitie 4 (Rusko I)90620 Oulu), KARIMIDEHKORDI, Ali (Nokia Solutions and Networks GmbH & Co. KGWerinherstrasse 9181541 ...